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A Data Matrix Method for Improving the Quantification of Element Percentages of SEM/EDX Analysis

John F. Kennedy Space Center, Florida
Sunday, November 01 2009
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A simple 2D M×N matrix involving sample preparation enables the microanalyst to peer below the noise floor of element percentages reported by the SEM/EDX (scanning electron microscopy/energy dispersive x-ray) analysis, thus yielding more meaningful data.

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